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Description
F2 is a probe designed for measuring the thickness of dielectric (lacquer, paint, powder, enamel, etc.) and current-conducting non-ferromagnetic (zinc, chrome, etc.) coatings up to 3 mm thick on quasi-planar and cylindrical ferromagnetic parts with medium surface roughness.
Features
- Probe with a spring-loaded plastic body featuring a V-shaped groove for positioning on cylindrical and spherical parts.
- Extended thickness measurement range (up to 3 mm).
- Increased wear resistance of the probe tip enables scanning measurements across the surface.
Basic technical characteristics
| Technical data | F2 | Units |
|---|---|---|
| measurement range, T | 0-3000 μm (0-3 mm) | |
| accuracy in measurement range: | 0-1 mm: ≤±(0.015T+0.001) mm | |
| 1-3 mm: ≤±0.02T mm | ||
| diameter of test area | Ø6 | mm |
| minimum diameter of substrate, Øconc ( Øconv) | 9.0 (1.5) | mm |
| dimensions | Ø18×86 | mm |
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