C Dynamic (Leeb) probe

C Dynamic (Leeb) probe

Dynamic (Leeb) probe for KT-C Hardness Tester.

Description

This low-impact-energy probe is designed for testing components where minimal indentation is required, parts with surface hardening or galvanic coatings, and thin-walled or impact-sensitive components.

Basic technical characteristics:
— dimensions, mm: Ø23 x 139;
— roughness Ra, µm: 1.6;
— min metal thickness, mm: 5.










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