DL Dynamic (Leeb) probe

DL Dynamic (Leeb) probe

Dynamic (Leeb) probe for KT-C Hardness Tester.

Description

This probe is designed for hardness measurement in hard-to-reach locations, confined spaces, and for inspection of internal surfaces.

Basic technical characteristics:
— dimensions, mm: Ø23 x 255;
— roughness Ra, µm: 3.2;
— min metal thickness, mm: 10.










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