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Description
Probe for measuring of thickness of dielectric (paint, anode oxide, powder, etc) and current-conducting non-ferromagnetic (tin, zinc, etc.) coatings upon articles made of current-conducting non-ferromagnetic materials within the range of up to 2000 µm.
Particulars
Probes with spring-loaded measuring system. Utilization of modern materials provides high strength and wear resistance of probe.
Features
- measurement range, T: 0-2000 µm (2 mm);
- measurement accuracy: ±0.02T µm;
- diameter of test area, mm: 4.7 ;
- size, mm: Ø6×35.
